Verification remains an integral and crucial phase of today’s microprocessor design and manufacturing process. However, with soaring design complexities and decreasing time-to-market windows, today’s verification approaches are incapable of fully validating a microprocessor before its release to the public. Increasingly, post-silicon validation is deployed to detect complex functional bugs in addition to exposing electrical and manufacturing defects.
Researchers at University of Michigan have developed a novel solution for post-silicon validation that exposes its native high performance. Random programs are generated in such a way that their correct final state is known at generation time, eliminating the need for an architectural simulation.
Applications and Advantages
- Verification of microprocessors defects
- More bugs identified
- Up to 20X faster than traditional flows